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Faculty of Mechanical Engineering
Metallography and microscopy

Focused Ion Beam milling with Scanning Electron Microscopy (FIB-SEM)

The FIB-REM Crossbeam XB 550L from Zeiss Microscopy is being used as part of the project “Spatially resolved characterization of process and stress influences on the structural properties and damage mechanisms of heterogeneous material systems” (DFG project no. 386509496).

Terms of use

Request for measurement time